2 edition of Digest of technical papers found in the catalog.
Digest of technical papers
International Quantum Electronics Conference (13th 1984 Anaheim, Calif.)
|Other titles||Technical digest.|
|Statement||Thirteenth International Quantum Electronics Conference, June 18-21, 1984, Anaheim, California ; cosponsored by American Physical Society, Optical Society of America, Quantum Electronics and Applications Society of the Institute of Electrical and Electronics Engineers.|
|Contributions||American Physical Society., Optical Society of America., IEEE Quantum Electronics and Applications Society.|
|LC Classifications||QC685 .I57 1984|
|The Physical Object|
|Pagination||152 p. :|
|Number of Pages||152|
|LC Control Number||83063308|
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SID's Digest of Technical Papers consists of short papers and poster session content from SID's annual symposium, Display Week. This content is available free to members online, as far back as This content is available free to members online, as far back as Digest of Technical Papers (set-ofbooks) - This book contains hundreds of Symposium presentations, on the following,but no content from other Display Week events: Active-Matrix Devices: Advances in the innovative development and implementation of active-matrix electronics into.
TableofContents KeynoteAddress 01 Liquid Crystals-AKeyComponentin LCDs-—3 WalterZywottek(MerckKGaA,Germany) 02 FutureTrendsin Information Displays 4 Hee-GookLee(LGElectronicsInc., Korea) 1. CrystallizationTechnologies [Invited] ExcimerLaser-induced Crystallization ofSi Filmsfor ManufacturingLTPSTFT-based Displays 7 U.
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Technical digest. Responsibility: Thirteenth International Quantum Electronics Conference, June, Anaheim, California ; cosponsored by American Physical Society, Optical Society of America, Quantum Electronics and Applications Society of the Institute of Electrical.
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Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study.
The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied. Digest of Technical Papers - IEEE International Solid-State Circuits Conference RG Journal Impact: * *This value is calculated using ResearchGate data and is based on average citation counts.
This paper proposes a new method to find out optimum overdrive (OD) values through visual inspection only. The method compares different OD values applied on a scrolling pattern. We found that the scrolling pattern with the height of 2° or smaller viewing angle is the best choice to find the optimum OD values.
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